Agenda

Texas-Wisconsin Model and Control Consortium
(TWMCC)

Monday, February 9th
8:30 a.m	Coffee and Donuts
9:00	Introduction/Agenda Overview	J. Qin
9:10	PI Overviews	J. Qin T. Edgar J. Rawlings
10:10	Multi-parametric nonlinear programming	E. Hale (UT)
10:40	Break
11:00	A Candidate to Replace PID Control: SISO MPC	J. Rawlings (UW)
11:30	Model-based distillation control	L. Rueda (UT)
12:00	Lunch (O's dining room)
1:15	Tutorial on Subspace and Closed-loop Identification	S.J. Qin (UT)
2:00	Subspace identification: errors-in-variables	J. Wang (UT)
2:30	Break
3:00	Subspace identification using parsimonious models	W. Lin (UT)
3:30	Closed-loop covariance estimation	M. Rajamani (UW)
4:00	Poster Session	K. Chamness, C. Harrison, S. Harrison, G. Cherry, W. Lin,J. Wang, E. Hale, P. He, J. Freese, J. Hedengren, L. Rueda, D. Castineira, T. Farmer, D. Thiele, K. Onodera (UT) M. Rajamani (UW)
5:30	Adjourn
6:00	Dinner – Threadgills Restaurant – 301 W. Riverside Drive 472-9304

Poster Session
University of Texas - Austin
K. Chamness	Etch Process Monitoring.
C. Harrison	New Developments in Closed-loop Performance Monitoring of SISO Processes.
S. Harrison	Multiscale Modeling of As-doped Ultrashallow Junction Formation.
G. Cherry	Multivariate Analysis for Semiconductor Fault Detection and Classification and Tool Performance Assessment.
W. Lin	Subspace identification with parsimonious formulation.
J. Wang	SIMPCA: Errors-In-Variables Subspace Identification and Its Application in Stochastic Fault Detection.
E. Hale	Multi-parametric Nonlinear Programming.
P. He	Fault diagnosis and visualization using FDA.
J. Freese	A Comparison of the Effects of Product Mix and Metrology Delay on the Performance of Segregated versus Threaded EWMA Control and an Initial look in to the Performance using and IMC Structure.
J. Hedengren	Dependency Analysis for DAE to ODE Conversion.
L. Rueda	Model-based Reactive Distillation Control.
D. Castineira	Flare Combustion Simulations.
T. Farmer	Glucose-Responsive Insulin Release Systems.
D. Thiele	Real-time state adaptation for Step response models.
K. Onodera	Job background in MCC and Future research area.
University of Wisconsin - Madison
M. Rajamani	Optimal Filter Gain Estimation from Data in Presence of Model Errors.

Tuesday, February 10th
8:00 a.m.	Meeting with PI's and Sponsors – Continental Breakfast
8:45	Industrial sponsor speaker	T. Sonderman (AMD)
9:30	A Multi-Step Supervisory Control Methodology for Semiconductor Device Manufacturing	C. Harrison/R. Good (UT)
10:00	Break
10:30	Multivariate Analysis for Semiconductor Fault Detection and Classification and Tool Performance Assessment	G. Cherry (UT)
11:00	Fault diagnosis and visualization using FDA	P. He (UT)
11:30	Multiscale Modeling of As-doped Ultrashallow Junction Formation.	S. Harrison
12:00	Adjourn