Agenda
Hosted by
Department of Chemical Engineering
The University of Texas, Austin, Texas 78712
February 5 - 6, 2007
ACES Building – Room 6.304
Monday, February 5th
8:30 a.m. | Coffee and Donuts | |
9:00 | Introduction/Agenda Overview | T. Edgar |
9:10 | PI Overviews | T. Edgar (UT) J. Qin (UT) J. Rawlings (UW) |
10:10 | Controller Performance Monitoring | S. Shah (U. Alberta) |
10:50 | Development of Insulin Release Systems for Glucose Control in Diabetic Patients | T. Farmer (UT) |
11:30 | Lunch (O’s dining room ACES 2.222) | |
1:00 p.m. | State Estimation Using Industrial Data and a Nonlinear Polymerization Model | M. Rajamani (UW) |
1:30 | Data-Driven Statistical MIMO Control Performance Monitoring and Diagnosis | J. Yu (UT) |
2:10 | Oil Production Optimization Using a Capacitance Model | D. Weber (UT) |
2:40 | Break | |
3:00 | Online Batch Process Monitoring Using Multiway PCA with Hybrid Wise Unfolding | Y. Zhang (UT) |
3.30 | Metrology Delay-dependent State Estimation in Semiconductor Manufacturing Systems | A. Prabhu (UT) |
4:00 | Recent Ruminations on Teaching of Process Control | T. Edgar (UT) |
4:30 | Poster Session | |
5:30 | Adjourn | |
6:30 | Dinner – Threadgills Restaurant – 301 W. Riverside (472-9304) |
Poster Session
Student |
Poster Title |
C. Alcala |
|
S. Abrol |
|
D. Barad |
Adaptive Disturbance Estimation Control |
B. Bregenzer |
Interplay Between Control and Scheduling Performance |
Y. Cai |
Production Planning and Scheduling Interaction and Coordination |
T. Farmer |
Development of Insulin Release Systems for Glucose Control in Diabetic Patients |
H. Lee |
Optimal Sampling with Various State Estimation Methods for Multiple Product and Process Environments in Semiconductor Manufacturing |
A. Prabhu |
Metrology Delay-dependent State Estimation in Semiconductor Manufacturing Systems |
M. Rajamani |
State Estimation Using Industrial Data and a Nonlinear Polymerization Model |
Q. Shen |
Structural Determination in Subspace System Identification |
C. Schoene |
Electrical Parameter Control for Semiconductor Manufacturing |
D. Thiele |
Automated tuning method for optimal MPC control performance with process model mismatch |
J. Yu |
Data-Driven Statistical MIMO Control Performance Monitoring and Diagnosis |
Y. Yu |
TBD |
D. Weber |
Oil Production Optimization Using a Capacitance Model |
K. Zhang |
TBD |
Y. Zhang |
Online Batch Process Monitoring Using Multiway PCA with Hybrid Wise Unfolding |
S. Ziaii |
Tuesday, February 7th
8:00 a.m. | Meeting with PI’s and Sponsors – Continental Breakfast | |
9:00 | Interplay Between Control and Scheduling Performance | B. Bregenzer (UT) |
9:30 | Optimal Sampling with Various State Estimation Methods for Multiple Product and Process Environments in Semiconductor Manufacturing | H. Lee (UT) |
10:10 | Break | |
10:30 | Automated Process Control at Texas Instruments Inc. | John Stuber (Texas Instruments) |
11:10 | Electrical Parameter Control for Semiconductor Manufacturing | C. Schoene (UT) |
11:50 | Adjourn |